Scanning Electron Microscopy
Scanning Electron Microscopy (SEM) is a powerful technique used in the field of microscopy and materials science to study the surface topography and composition of a wide range of samples. SEM is based on the interaction of a focused electron beam with a sample's surface.
Scanning Electron Microscope, JEOL (JSM-IT200 ) is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScopeTM, with significantly higher throughput. Specimen Exchange Navi, a beginner-friendly function, offers guided operation from sample loading to area search, and SEM image observation. “Zeromag” for seamless transition from optical to SEM imaging, “Live Analysis”*2 for real time display of elemental analysis results, SMILE VIEW（TM） Lab for seamless report generation of observation and/or analysis results, etc., provide fast analysis with integrated transition from OM to SEM. Fast observation, analysis and report generation! JEOL InTouchScope™ series, the high performance analytical tool with major three functions.
SERVICES OFFERED:
(Price varies depending on the service/s offered)
SAMPLE TESTING ONLY
SAMPLE TESTING WITH DATA INTERPRETATION
(Certified from our resident chemist or chemical engineer)
For Bookings:
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